Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501133 | Scripta Materialia | 2008 | 4 Pages |
Abstract
In this study we have identified ultrafine grains in the subsurface of a machined tantalum surface. It has been shown that precision sectioning using focused ion beam milling and imaging using ion-induced secondary electrons are capable of resolving ultrafine grains of the order of 150–200 nm. A good correlation has been found between X-ray full-width-at-half-maximum data and the microstructural variation as a function of depth.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
J. Sarkar, P.S. Gilman,