| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1501134 | Scripta Materialia | 2008 | 4 Pages |
Abstract
We present here for the first time observations that grain boundaries in electrodeposited (ED) nanocrystalline (nc) Ni are predominantly of Σ3 character. The results presented are based on orientation imaging microscopy (OIM) performed to produce electron backscatter diffraction (EBSD) maps. This large volume fraction of coherent low sigma coincidence site lattice (CSL) boundaries appears to be consistent with the superior corrosion resistance of ED nc-Ni in comparison with its coarse-grained counterpart.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
I. Roy, H.W. Yang, L. Dinh, I. Lund, J.C. Earthman, F.A. Mohamed,