| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1501198 | Scripta Materialia | 2009 | 4 Pages |
Abstract
Elemental processes underlying the temperature-initiated decomposition of low-conductive Ti–Al–N thin films is investigated on an atomic-scale by laser-assisted three-dimensional atom probe tomography. This allows three-dimensional observation of spinodal decomposition in Ti–Al–N. Experimental evidence is presented for the formation of an interconnected network of Ti- and Al-rich domains and the subsequent phase transformation under increased thermal load to a dual phase structure of TiN and AlN areas.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
R. Rachbauer, E. Stergar, S. Massl, M. Moser, P.H. Mayrhofer,