Article ID Journal Published Year Pages File Type
1501287 Scripta Materialia 2008 4 Pages PDF
Abstract

We inspect the accuracy of a standard analysis, here a Williamson–Hall variant, for determining the grain size and microstrain of nanocrystalline samples by analysis of X-ray diffraction data. The diffractograms were computer-generated, based on large samples of nanocrystalline Pd obtained by molecular dynamics simulation. The algorithm supplies accurate grain size values. Remarkably, although the grain interiors are free of lattice defects, the microstrain is significant and matches closely that of experiments on samples of similar grain size.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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