Article ID Journal Published Year Pages File Type
1501309 Scripta Materialia 2008 4 Pages PDF
Abstract

Nanocrystalline (50-μm-thick) Ni films with controlled surface morphology at the nanoscale were synthesized by direct-current electrodeposition of Ni on an Si substrate under different electrochemical conditions. A relationship between spatial roughness scaling and mean grain size in electrodeposited Ni was established using X-ray diffraction and atomic force microscopy. Fractal analysis showed a transition from self-affine to ultrasmooth surfaces. A non-destructive method is demonstrated to estimate the grain size distribution of ultrasmooth nanocrystalline Ni surfaces by atomic force microscopy with high-resolution probes.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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