Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501309 | Scripta Materialia | 2008 | 4 Pages |
Abstract
Nanocrystalline (50-μm-thick) Ni films with controlled surface morphology at the nanoscale were synthesized by direct-current electrodeposition of Ni on an Si substrate under different electrochemical conditions. A relationship between spatial roughness scaling and mean grain size in electrodeposited Ni was established using X-ray diffraction and atomic force microscopy. Fractal analysis showed a transition from self-affine to ultrasmooth surfaces. A non-destructive method is demonstrated to estimate the grain size distribution of ultrasmooth nanocrystalline Ni surfaces by atomic force microscopy with high-resolution probes.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
F. Sansoz, K.D. Stevenson, R. Govinthasamy, N.S. Murthy,