Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501744 | Scripta Materialia | 2008 | 4 Pages |
Abstract
(0 0 l)-oriented Pb(Zr0.5Ti0.5)O3/CoFe2O4 (PZT/CFO) multilayer thin films were fabricated with a change in stacking periodicity. When the periodicity increased, a size effect on both ferroelectric and ferromagnetic properties was observed. This result indicates the existence of a passive layer at the PZT/CFO interface. Consequently, the magnetoelectric coupling was significantly degraded with increasing stacking periodicity. From transmission electron microscopy analysis, in addition to slight interdifussion, a highly roughened interface structure is believed to be responsible for the formation of the passive layer.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Rueijer Lin, Tai-bor Wu, Ying-Hao Chu,