| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1501745 | Scripta Materialia | 2008 | 4 Pages |
Abstract
Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Masaki Tanaka, Kenji Higashida, Kenji Kaneko, Satoshi Hata, Masatoshi Mitsuhara,