Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501799 | Scripta Materialia | 2008 | 4 Pages |
Abstract
We present a selected area nanodiffraction fluctuation electron microscopy (FEM) technique implemented on a conventional transmission electron microscope. Nanodiffraction patterns from a Pd-based metallic glass, collected using a selected area aperture 15 × 15 nm in effective size, display inhomogeneous speckling due to the small volume sampled. We compare the azimuthal intensity variance from these patterns to the spatial intensity variance from tilted dark-field measurements on the same specimens and find reasonable qualitative agreement, including features characteristic of medium-range order.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
S.O. Hruszkewycz, T. Fujita, Mingwei W. Chen, Todd C. Hufnagel,