Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501810 | Scripta Materialia | 2010 | 4 Pages |
Abstract
The Si concentration in the Mo solid solution in ternary Mo-rich Mo–Si–B alloys was measured at room temperature and significantly higher levels than those previously reported were documented. Annealing at 1200 and 800 °C failed to produce any decrease in the Si level in solid solution, a consequence of sluggish diffusion kinetics. Measurements confirmed a continuous increase in microhardness of the solid-solution phase with the measured Si level; the results are helpful in rationalizing the high-temperature strength in multiphase alloys.
Related Topics
Physical Sciences and Engineering
Materials Science
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Authors
P. Jain, K.S. Kumar,