Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501946 | Scripta Materialia | 2008 | 4 Pages |
Abstract
The critical nucleation parameters, such as radius of the critical nucleus, critical free energy change and number of molecules in the critical nucleus, have been evaluated for the first time for Zn1âxMnxO films on a sapphire substrate. Zn1âxMnxO films grown on sapphire substrates by radiofrequency sputtering have been characterized using X-ray diffraction and vibrating sample magnetometry. The variation of structural and magnetic properties due to Mn concentration has been interpreted by numerically evaluated critical nucleation parameters.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
N. Gopalakrishnan, J. Elanchezhiyan, K.P. Bhuvana, T. Balasubramanian,