Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501957 | Scripta Materialia | 2009 | 4 Pages |
Abstract
This paper presents an anisotropy Monte Carlo algorithm to simulate grain growth in nanocrystalline films. The results indicate that a thickness effect appears only when the average grain size reaches 0.8–1.2 times the film thickness. A grain size-thickness factor is introduced to modify Burke’s grain growth kinetic equation, better describing the whole process of grain growth in both simulation and Ni/SiO2 nanocrystalline multilayer films. A more universal kinetic equation of grain growth is further suggested.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Zhinan An, Hong Ding, Qingping Meng, Yonghua Rong,