Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1502406 | Scripta Materialia | 2006 | 4 Pages |
Abstract
The edge-to-edge matching model, which was originally developed for predicting crystallographic features in diffusional phase transformations in solids, has been used to understand the formation of in-plane textures in TiSi2 (C49) thin films on Si single crystal (0 0 1)Si surface. The model predicts all the four previously reported orientation relationships between C49 and Si substrate based on the actual atom matching across the interface and the basic crystallographic data only. The model has strong potential to be used to develop new thin film materials.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
M.-X. Zhang, P.M. Kelly,