Article ID Journal Published Year Pages File Type
1502415 Scripta Materialia 2006 4 Pages PDF
Abstract

A combined experimental/simulation approach has been used to characterize the underlying deformation mechanisms associated with stress-assisted grain growth in nanocrystalline Al. Strain rate sensitivity experiments on freestanding submicron thin films undergoing stress-assisted grain boundary migration have uncovered rate sensitivities up to two orders of magnitude larger than previously reported for microcrystalline Al. Molecular dynamics simulations have been used to illustrate that these high strain rate sensitivities coincide with those associated with grain boundary processes such as migration, sliding, and dislocation nucleation.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
, , , ,