In situ X-ray diffraction study of Co/Pd multilayers grown on Ta substrate during hydrogen loading

For Co/Pd multilayers deposited on Ta the volumetric strain upon hydrogen loading is determined from the measured lattice parameter using Hooke’s law. We found that the hydrogen completely diffuses out of the multilayer after exposing the sample to an argon atmosphere or to air, whereas it remains dissolved in the substrate. This causes a biaxial in-plane stress in the multilayer. We observed a change in the hydrogen solubility in the multilayer for varying in-plane stress.