| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1502546 | Scripta Materialia | 2009 | 4 Pages |
Abstract
The critical thickness of a film for the formation of a misfit dislocation in the system of a strained film grown on a nanopore is studied. The influence of the ratio of the shear modulus between the film and the substrate, the misfit strain and the radius of the nanopore on the critical thickness of the film is discussed. New phenomena concerning the critical thickness of the film are obtained due to the difference in elastic constants of the film and the substrate.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Q.H. Fang, J.H. Chen, P.H. Wen, Y.W. Liu,