Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1502684 | Scripta Materialia | 2009 | 4 Pages |
Abstract
The implantation profile of boron in silicon annealed at 600 °C for 1 h as given by laser-assisted wide-angle atom probe was found to be in good agreement with secondary ion mass spectrometry data. Numerous boron clusters in the form of tiny platelets (3–6 nm diameter, 2 nm thick) were identified and interpreted as boron interstitial clusters (BICs). These BICs contained on average 7 at.% B with a core level that reaches 10 at.%.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
O. Cojocaru-Mirédin, E. Cadel, F. Vurpillot, D. Mangelinck, D. Blavette,