| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1502790 | Scripta Materialia | 2006 | 5 Pages |
Abstract
Relative free energies of 〈1 1 1〉 tilt boundaries in 1.7-μm-thick Al films were compared with boundary enthalpies obtained via molecular dynamics simulations. Grain growth studies in 25 and 100-nm-thick Al films were compared with simulations. The sources of the differences between experimental and simulational results are discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
K. Barmak, J. Kim, C.-S. Kim, W.E. Archibald, G.S. Rohrer, A.D. Rollett, D. Kinderlehrer, S. Ta’asan, H. Zhang, D.J. Srolovitz,