| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1502827 | Scripta Materialia | 2008 | 4 Pages |
Abstract
The interdiffusion of Pd-Ag thin film diffusion couples is investigated by transmission electron microscopy and X-ray diffractometry at a temperature of 723Â K. By comparison with calculated diffractograms, it is shown that a diffusion-induced recrystallization takes place, which produces a first generation of new grains with a dominant composition of 24.5Â at.% Pd inside the diffusion zone.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
D. Baither, T.H. Kim, G. Schmitz,