Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1502896 | Scripta Materialia | 2006 | 6 Pages |
Abstract
The measured hardness of nanocrystalline Cu with grain sizes (d) as small as 10 nm still follows the Hall–Petch relation. A rate sensitivity of 0.06 ± 0.01 and a flow stress activation volume of 8b3 were determined at d = 10 nm, suggesting grain boundary activities are enhanced but not yet dominant in the plastic deformation.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
J. Chen, L. Lu, K. Lu,