Article ID Journal Published Year Pages File Type
1502989 Scripta Materialia 2007 4 Pages PDF
Abstract

The character of the boundaries surrounding island grains embedded in abnormally growing grains in a Fe–1%Si alloy was investigated using electron backscatter diffraction and orientation imaging microscopy techniques. The grain boundary misorientation is the primary method used for this characterization. It was found that the island grains were most frequently misoriented by 55–60° about 〈1 1 1〉 directions from their respective host abnormally large grains. Host–island grain interfaces were predominantly of Σ3 character and low-angle grain boundaries, which have typically been associated with low mobility. It is reasonable to conclude that these boundaries were “left behind” by the faster growing abnormally large grains.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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