| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1503009 | Scripta Materialia | 2006 | 5 Pages |
Abstract
X-ray line profile analysis is an efficient non-destructive technique to determine some key statistical properties of the dislocation structures developing during plastic deformation. In the first part of the paper, X-ray line profile measurements obtained on compressed Cu single crystals are presented. After this a simple dislocation density evolution model based on the experimental results is proposed.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
I. Groma, F. Székely,