Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1503708 | Scripta Materialia | 2006 | 4 Pages |
Abstract
The reliability of microelectronic devices is critically affected by the texture of the thin films. It has been demonstrated that ion bombardment during film growth, a process known as ion beam assisted deposition, is an effective tool for texture control. In particular, the use of two beams allows selection of both the in-plane and the out-of-plane texture. In this paper we show that post-deposition ion bombardment of strongly (1 1 1)-fiber textured Au films leads to the preferred growth of a single orientation, thus proving that single crystalline thin films can be fabricated without the use of molecular beam epitaxy technologies.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Ralph Spolenak, M. Teresa Pérez Prado,