Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1504621 | Solid State Sciences | 2013 | 6 Pages |
Abstract
The GexIn8Se92âx glasses (14 â¤Â x â¤Â 23.5) were extensively characterized by X-ray diffraction (XRD). The chemical composition is determined using energy dispersive spectrometers (EDS). The atomic structure of these glasses is investigated by using (XRD) technique. The first sharp diffraction peak (FSDP) in the structural factor indicates the existence of medium range order (MRO) in these glasses. The position of the FSDP and its full width at half maximum (FWHM), obtained after fitting the XRD of the glasses. The repetitive characteristic distance, R and structural correlation length, L, which characterizing the intermediate structure are deduced. The effect of composition and average coordination number , on the atomic volume, the density and compactness are studied. The connectivity of the system is discussed in terms of the total number of constraints which also influence the mean bond energy of the system. The intensity of the FSDP, the atomic volume and compactness of the structure, have anomalous change at  = 2.67 indicating, a topological threshold occurs. The occurrence of this dependence leads to the Ge content has a marked effect on the MRO and physical properties parameters.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
N. El-Kabany, M.M. Hafiz,