Article ID Journal Published Year Pages File Type
1505116 Solid State Sciences 2011 5 Pages PDF
Abstract
► The phase change characteristics of HfO2 doping on GeTe in application for phase change memory were studied. ► The incorporation of HfO2 can improve the thermal stability of amorphous GeTe film. ► The GeTe-HfO2-based phase change memory exhibits lower power consumption than widely used Ge2Sb2Te5-based one.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
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