| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1506115 | Solid State Sciences | 2009 | 5 Pages |
The polycrystalline samples of Pb(Zr0.65−xMnxTi0.35)O3 (x = 0, 0.05, 0.10, 0.15) (PZMT) were prepared by a high-temperature solid-state reaction technique. Structural properties of the compounds were examined using an X-ray diffraction (XRD) technique to confirm the formation of single-phase compounds (with perovskite structure) at room temperature. Microstructural analysis of the surface of the compounds by scanning electron microscopy (SEM) exhibits that there is a significant change in grain size on introduction, at the Zr-site, of Mn. Detailed studies of the dielectric properties of PZMT show a measurable shift in Tc, change in dielectric constant, and ac conductivity.
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