| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1506137 | Solid State Sciences | 2009 | 4 Pages |
Tin oxide submicronwires doped with Fe element were prepared by the thermal evaporation method. Morphological and structural characterizations revealed wires with sub micron size and crystalline in nature. The field electron emission from the single Fe:SnO2 wire was carried out in conventional field emission microscope. The Fowler–Nordheim plot obtained from I–V characteristics of the wire showed a linear behavior typical that of metal. The field enhancement factor estimated from the slope of the F–N plot is 7455 cm−1, indicating that the field emission is from nanometric features of the emitter. A current density of 10 A/cm2 has been obtained at an applied field of 4.845 × 103 V/μm. The field emission current–time record at a current level of 1 μA for more than 3 h duration is promising for various field emissions based applications.
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