Ageing and fatigue of lead titanate and lead zirconate titanate thin ferroelectric films

The phenomena of ageing and fatigue have been experimentally investigated in lead titanate and lead zirconate titanate thin ferroelectric films for samples on different substrates and with different materials of the measuring electrodes. A certain broadening of the dielectric permittivity peak is observed for the films on the silicon substrate after a year keeping without external actions. The lead titanate films on corundum substrates did not demonstrate visible changes in structural and dielectric parameters in the course of this time. In the course of repeated cycling the reduction of switching polarization in the lead titanate and lead zirconate titanate films on silicon substrates takes place at considerably greater number of cycles as compared to the same films on corundum substrates under the identical conditions. The above changes of dielectric and switching characteristics can be relevant to the changes in the domain structure of the materials under investigation in the process of their ageing and repeated switching. The reason for the acceleration of the ageing processes in the films on corundum substrates could be either an increase in the absolute magnitude of the switching field or an increase of the internal bias field, that facilitate the migration of oxygen vacancies in the films with the perovskite structure to the electrode–ferroelectric surface with the consequent fixation of domain walls.

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