| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1506521 | Solid State Sciences | 2007 | 7 Pages |
The structure and electrical resistivity of Ho1−xTixCo2–hydrides (x = 0.1–0.6) have been determined through the powder X-ray diffraction (XRD) and temperature dependence of electrical resistivity (ρ(T)) at different hydrogen concentrations. The variations in the lattice parameters in different phase regions and the lattice expansion with respect to the hydrogen concentration have been studied. The temperature dependent electrical resistivity of hydrides has been discussed based on the conduction electron scattering and spin fluctuation scattering mechanisms. The changes in ρ(T) upon Ti substitution and increasing concentration of hydrogen have been discussed and the results have been correlated with their structural properties.
Graphical abstractThe hydrogen induced (a) structural changes and (b) temperature dependent electrical resistivity of Ho0.7Ti0.3Co2-HyFigure optionsDownload full-size imageDownload as PowerPoint slide
