Article ID Journal Published Year Pages File Type
1507435 Cryogenics 2014 13 Pages PDF
Abstract
In spite of the recent advances achieved with superconducting fault current limiters (SCFCL's), modeling and simulation of such devices are still important issues. There are different approaches for modeling SCFCL's, whereas computational simulations provide a better understanding of the behavior of SCFCL devices. In addition, results of hard experimental access may be achieved by means of computational simulation. The aim of this paper is to present a simple computational model to predict both the electrical and thermal behaviors of SCFCL devices. The main contribution of the present work is the use of a thermal-electrical analogy to solve the heat transfer equations inside SCFCL sub-components, which enables one to handle with relative easy the strong and nonlinear coupling between thermal and electrical phenomena. The limitation and quenching behavior of a resistive SCFCL assembly was investigated for overcurrents up to 67 kArms (Vo = 1 kVrms). Simulation results were compared to overcurrent experimental tests. A good agreement between simulations and tests has been found in the present work. Moreover, the results of the developed model were also compared with finite element results reported in the literature.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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