Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1508231 | Cryogenics | 2008 | 6 Pages |
Abstract
This paper presents experimental results of a 2-GHz band gallium nitride high electron mobility transistor (GaN HEMT) amplifier cryogenically-cooled to 60Â K as a part of the cryogenic receiver front end (CRFE) for mobile base station receivers. At a temperature of 60Â K, the GaN HEMT amplifier attains the maximum power added efficiency of 62%, the saturation output power of 35Â dBm, the gain of 26Â dB, and the noise figure of 2.6Â dB when operating at class-AB biasing. The results reported herein are the first on the performance of a cryogenically-cooled GaN HEMT amplifier aiming at use in a 2-GHz band CRFE.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Y. Suzuki, S. Narahashi, T. Nojima,