| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1508597 | Cryogenics | 2006 | 10 Pages |
Abstract
This paper summarizes the results of some top-level sensitivity studies that characterize the effects of FPA annealing on a solid hydrogen cryostat-using the WISE cryostat and focal plane assemblies as a model. These trades provide a vector for candidate system level changes to the WISE instrument to help mitigate the impact of the annealing process on the cryostat's performance.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Larry Naes,