Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1512903 | Energy Procedia | 2013 | 6 Pages |
Tube diffusion is the de facto industry standard for emitter formation for silicon wafer solar cells. In this paper, we report on optimised dopant profiles to produce a lightly doped emitter (LDE) with a lower surface dopant concentration. Solar cells are fabricated with a LDE and achieve a significant gain in open-circuit voltage (Voc) due to a reduced front surface and emitter recombination. The POCl3 tube diffusion process is optimised by introducing a pre-oxidation and multi-plateau drive-in during the diffusion process. Using the optimised process, the surface dopant concentration of our tube diffused n+ emitter is reduced from 4.5x1020 to 2.5x1020 atoms/cm3 for a ∼70 Ohms/sq emitter. An increase of 4 mV in Voc, 0.2 mA/cm2 in short-circuit current Jsc and 0.2% absolute increase in efficiency is achieved for solar cells using a LDE compared to solar cells with our standard emitter profile. The average fill factors for the standard and LDE batches are above 79%, suggesting the Ag paste (DuPont Solamet PV17F) used in this work had no issues in contacting the lower surface concentration of the LDE.