| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1513188 | Energy Procedia | 2012 | 6 Pages |
Abstract
In this work, the influence of the c-Si surface finishing (hydrophobic/hydrophilic) prior to the deposition of the Al2O3 passivation layer on the passivation quality is investigated. The samples are characterized by a combination of Quasi-Steady-State-PhotoConductance (QSSPC) Capacity-Conductance (CV), X-ray Photoelectron Spectroscopy (XPS) and Fourier Transformed InfraRed (FTIR) measurements. Furthermore, FTIR measurements are used to determine the thickness of interfacial SiOx layer.
Related Topics
Physical Sciences and Engineering
Energy
Energy (General)
