In-depth analysis of transient errors of inline IV measurements

Silicon solar cells are prone to transient effects during fast acquisition of the illuminated IV parameters, as it is commonly carried out using industrial cell testers. It is known that the IV curve sweep time and direction have a significant impact on the measured fill factor and open circuit voltage. Within this contribution, the hysteresis effect on the fill factor and the open circuit voltage are investigated for different types of industrially fabricated silicon solar cells. This investigation is carried out on two different, commonly used, flash-based cell testers.