Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1514667 | Energy Procedia | 2011 | 6 Pages |
Abstract
3D surface profiles obtained from a variety of mono-crystalline wafers textured under different conditions were investigated. Topographical parameters taking single pyramids heights and distances into account were analysed with regard to their statistical distribution. The statistical analysis yielded appropriate distribution functions allowing for quantitative description and comparison of random pyramid surfaces.
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