Article ID Journal Published Year Pages File Type
1514683 Energy Procedia 2011 6 Pages PDF
Abstract
This paper presents the results of thin film silicon (Si) solar cells with in-situ doped epitaxial emitter deposited on Si substrate by rapid thermal chemical vapor deposition (CVD). High resolution transmission electron microscopy (HRTEM) images reveal that low temperature Si epitaxy growth induces mechanical twins at the junction interface. The presence of the twins alters the orientation of the crystal planes, increases the optical path length of light within the epitaxy film and improves the optical absorption. On the other hand, these twins appear to be the main cause for material-induced shunting at the p-n junction. Photoluminescence (PL) mapping indicate that lower growth temperature results in better interface quality.
Related Topics
Physical Sciences and Engineering Energy Energy (General)
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