| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1517077 | Journal of Physics and Chemistry of Solids | 2008 | 4 Pages |
Abstract
Cd1âxMnxTe thin films were fabricated by thermal interdiffusion of multilayers of sputtered compound semiconductors as well as thermally evaporated elements. Electron microscopy revealed their nanostructures. The alloys have been investigated for evaluation of optical and electronic parameters. Spectrophotometry helped to find out the bandgap and composition; photoluminescence was used for observing relative transition probabilities at room temperature. Photoresponse showed the light dependence of the resistance of the alloy films. Hall measurements and four-probe tests indicated the influence of manganese on the room-temperature electronic properties of the alloy.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Pushan Banerjee, Biswajit Ghosh,