Article ID Journal Published Year Pages File Type
1517723 Journal of Physics and Chemistry of Solids 2008 4 Pages PDF
Abstract
The magnitude and direction of charge transfer in GaAs at various temperatures have been analyzed using our precise and extensive single-crystal X-ray diffraction data. The charge transfer parameters were obtained by employing a quadratic equation method and precise X-ray structure factors collected at 170, 200, 250 and 300 K. A transfer of charge from gallium atom to arsenide atom is evidenced at all the above temperatures.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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