| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1517736 | Journal of Physics and Chemistry of Solids | 2008 | 5 Pages |
Abstract
The photo-induced AC-impedance method is used as a versatile instrumentation to study the trap state densities and the carrier relaxation times in magneto-resistive manganites and magneto-conductive manganates and thus as a probe to check the crystal quality, which is important for the performance of any device material. A comparative study using compounds of different defect densities is presented. High defect concentrations in the compounds are identified through the photoresistivity and/or the photo-induced capacitive build up.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
K. Ragavendran, V. Morchshakov, A. Veluchamy, Klaus Bärner,