| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1518411 | Journal of Physics and Chemistry of Solids | 2007 | 5 Pages |
Abstract
The response of amorphous As50Se50 pulsed laser deposited (PLD) films to annealing and irradiation, was investigated by X-ray and UV-photoelectron spectroscopies. It is shown that annealing smoothes out structural as well as electronic defects, while irradiation with near band-gap light enhances the film's “chemical disorder” and causes the creation of electronic defects. The observed behavior of the films is compared to that of thermally evaporated films and the corresponding bulk glasses.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
M. Kalyva, A. Siokou, S.N. Yannopoulos, P. Ne˘mec, M. Frumar,