| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1518441 | Journal of Physics and Chemistry of Solids | 2007 | 5 Pages |
Abstract
We describe the construction of a cell that enables the electrical resistance of a material to be measured simultaneously with the collection of powder neutron diffraction data at elevated temperatures. The cell has been used to investigate the origin of the anomalous electron-transport properties of the monosulphide, CrS. The data reveal that a decrease in electrical resistance above 573 K is associated with the disappearance of semiconducting monoclinic CrS and the concomitant growth of a disordered CdI2-type metallic phase.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Anthony V. Powell, T. Erinc Engin, Paz Vaqueiro, Steve Hull,