Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1518494 | Journal of Physics and Chemistry of Solids | 2005 | 4 Pages |
Abstract
A nine-element analyzer system for inelastic X-ray scattering has been designed and constructed. Each individual analyzer crystal is carefully aligned with an inverse joystick goniometer. For the analyzers silicon wafers with 100Â mm diameter are spherically bent to 1 or 0.85Â m radius, respectively. Additionally, an analyzer with an extra small radius of 0.182Â m and diameter of 100Â mm was constructed for X-ray absorption spectroscopy in fluorescence mode. All analyzer crystals with large radius have highly uniform focusing property. The total energy resolution is approximately 0.5Â eV at backscattering for the 1Â m radius Si(440) analyzer array and approximately 4Â eV for the 0.182Â m radius Si(440) analyzer at 6493Â eV.
Related Topics
Physical Sciences and Engineering
Materials Science
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Authors
Q. Qian, T.A. Tyson, W.A. Caliebe, C.-C. Kao,