Article ID Journal Published Year Pages File Type
1518495 Journal of Physics and Chemistry of Solids 2005 7 Pages PDF
Abstract

The realization of spherical crystal analyzers for inelastic X-ray scattering experiments (IXS) is an ongoing project at the ESRF since 1992. We developed reliable techniques to routinely produce silicon spherical analyzers with very high (ΔE=1÷10 meV) and high energy resolution (ΔE=0.2÷1.5 eV), and with very good focal properties and efficiency. In this article we report the state of the art of the analyzer construction and the main improvements made during the last years.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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