| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1518537 | Journal of Physics and Chemistry of Solids | 2007 | 4 Pages |
Abstract
Zinc oxide (ZnO) films were deposited on glass substrates by the sol–gel dip coating method using acrylamide route. The films were characterized by X-ray diffraction studies which indicated wurtzite structure. Optical absorption measurements indicated band gap in the range 3.17–3.32 eV. XPS studies indicated the formation of ZnO. The resistivity of the films were in the range 1000–10,000 ohm cm.
Related Topics
Physical Sciences and Engineering
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Authors
K.R. Murali,