Article ID Journal Published Year Pages File Type
1519218 Journal of Physics and Chemistry of Solids 2006 5 Pages PDF
Abstract
Layered manganate Ba6Mn5O16 was prepared by a traditional solid-state reaction method and its microstructure at atomic level was investigated in detail by means of high-resolution transmission electron microscopy (HRTEM). Although the sample shows, from the XRD data, a nearly single-phase n=5 layered Ba6Mn5O16 phase of the hexagonal Ban+1MnnO3n+1 homologous series, the presence of numerous structural defects, especially intergrowth faults of the hexagonal Ban+1MnnO3n+1 homologous series with different n in it, was revealed by HRTEM. Furthermore, a minor 2H BaMnO3 phase was also found to coexist with the layered Ba6Mn5O16 phase. These defects could have a correlation with the magnetic properties of the sample, i.e. the TN being very broad and the appearance of the Curie tail in the susceptibility.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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