Article ID Journal Published Year Pages File Type
1522155 Materials Chemistry and Physics 2014 6 Pages PDF
Abstract
It is well known that a TiC layer can be formed and should act as a buffer layer in diamond films deposited on Ti alloy. Through our cross-sectional investigation in HRTEM, a thin layer (20-30 nm) was first identified between the outermost diamond film and the inner reactive TiC layer adjacent to the substrate. This layer consists of numerous crystalline nanoparticles with grain sizes of 5-20 nm. Through electron nanodiffraction patterns combined with EDS and EELS analysis, these nanoparticles can be identified as a TiC1−xOx phase with a similar structure to cubic TiC. Besides, C atoms and O atoms in TiC1−xOx randomly occupy the vacancies of C in TiC. The thickness of this TiC1−xOx layer does not change significantly with increasing deposition time, and the diamond phase directly nucleates and grows on it.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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