| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1523304 | Materials Chemistry and Physics | 2012 | 8 Pages |
Abstract
⺠Dielectrics growth and characterization is one of the most hot topics of materials science and microelectronics. ⺠CaCu3Ti4O12 perovskite, recently, demonstrated to possess peculiar dielectric properties (Science, 2001, 293, 673-676). ⺠To date no deep discussion on the growth processes, properties and perspective of CCTO thin films has been proposed. ⺠Our paper is an effective example of interdisciplinarity, since the comparison between PLD and MOCVD has been addressed. ⺠Great attention has been paid to CaCu3Ti4O12 film/substrate interfaces since dielectric properties are strongly affected.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Maria R. Catalano, Graziella Malandrino, Corrado Bongiorno, Roberta G. Toro, Patrick Fiorenza, Romain Bodeux, Jerome Wolfman, Monique Gervais, Cécile Autret Lambert, François Gervais, Raffaella Lo Nigro,