| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1523324 | Materials Chemistry and Physics | 2012 | 5 Pages |
Abstract
The RbPb2Br5 crystal has been grown by Bridgman method. The electronic structure of RbPb2Br5 has been measured with XPS for a powder sample. High chemical stability of RbPb2Br5 surface is verified by weak intensity of O 1s core level recorded by XPS and structural RHEED measurements. Chemical bonding effects have been observed by the comparative analysis of element core levels and crystal structure of RbPb2Br5 and several rubidium- and lead-containing bromides using binding energy difference parameters ΔRb = (BE Rb 3d − BE Br 3d) and ΔPb = (BE Pb 4f7/2 − BE Br 3d).
► Bridgman growth of RbPb2Br5 crystal. ► Electronic structure measurements with XPS. ► Optical crystalline surface fabrication.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
V.V. Atuchin, L.I. Isaenko, V.G. Kesler, L.D. Pokrovsky, A.Yu. Tarasova,