Composition, annealing and thickness dependence of structural and optical studies on Zn1âxMnxS nanocrystalline semiconductor thin films

Article ID	Journal	Published Year	Pages	File Type
1523656	Materials Chemistry and Physics	2012	10 Pages	PDF

Abstract

âº The structural and optical properties of Zn1âxMnxS thin films were studied. âº The micro structural parameters of the films have been determined. âº The room temperature reflectance and transmittance data are analyzed. âº The refractive index and energy gap are determined. âº The single oscillator parameters were calculated.

Keywords

Single oscillator parameters optical properties Nanomaterial XRD

Related Topics

Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials

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Composition, annealing and thickness dependence of structural and optical studies on Zn1âxMnxS nanocrystalline semiconductor thin films

Authors

M. El-Hagary, M. Emam-Ismail, E.R. Shaaban, A. Al-Rashidi, S. Althoyaib,