| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1523796 | Materials Chemistry and Physics | 2012 | 9 Pages |
Abstract
⺠A refinement of the lamellar microstructure was observed after electromigration. ⺠The strain induced by electromigration under a high current density is estimated. ⺠A possible mechanism on the formation of nano-scale lamellae is proposed. ⺠Electromigration induced two extreme microstructure changes is compared.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Fan-Yi Ouyang, K.N. Tu, Yi-Shao Lai,